fix: BLE TX 먹통 해결 및 메모리 안전성 개선

- binary_tx_handler를 dr_binary_tx_safe로 전체 교체 (APP_ERROR_CHECK 제거)
- data_tx_handler APP_ERROR_CHECK → DBG_PRINTF 교체
- memset/memcpy 하드코딩 크기를 define 상수로 교체 (버퍼 오버런 수정)
- SERIAL_NO_LENGTH, HW_NO_LENGTH, PASSKEY_LENGTH를 main.h로 통합
- 미사용 HW 드라이버/EEPROM 코드 삭제, TWI를 i2c_manager.c로 통합
- EEPROM → FDS 전환, 코드 리뷰 현황 문서 추가

Co-Authored-By: Claude Opus 4.6 <noreply@anthropic.com>

project/ble_peripheral/ble_app_bladder_patch/battery_saadc.c

@@ -22,7 +22,6 @@
 //#include "fstorage.h"
 #include "battery_saadc.h"
 #include "main_timer.h"
-#include "meas_pd_48.h"
 #include <cmd_parse.h>
 #include "debug_print.h"
 #define BATTERY_REF_VOLTAGE_IN_MILLIVOLTS   600                                     /**< Reference voltage (in milli volts) used by ADC while doing conversion. */
@@ -52,8 +51,8 @@ bool low_battery_check = false;
 extern bool info4;   //cmd_parse
 
 // cj add edit 25/11/24
-extern volatile uint16_t info_p1;
-extern volatile uint16_t info_p2;
+volatile uint16_t info_p1;
+volatile uint16_t info_p2;
 
 
 extern char		ble_tx_buffer[BLE_NUS_MAX_DATA_LEN];
@@ -63,7 +62,7 @@ extern volatile bool processing;
 extern which_cmd_t cmd_type_t;
 
 extern uint8_t ble_bin_buffer[BLE_NUS_MAX_DATA_LEN]	;
- extern volatile uint16_t info_batt;  //48_c
+ volatile uint16_t info_batt;  //48_c
 	extern bool go_temp;   //
 		extern bool go_batt;   //cmd_parse
 
@@ -133,7 +132,7 @@ void pressure_all_event_handler(nrf_drv_saadc_evt_t const * p_event)
 					    result_data[0] = p1_mV;
 							result_data[1] = p2_mV;
 							format_data(ble_bin_buffer, "rpn:", result_data,2);
-							binary_tx_handler(ble_bin_buffer,4);
+							dr_binary_tx_safe(ble_bin_buffer,4);
 								
           
         }
@@ -199,7 +198,7 @@ void battery_event_handler( nrf_drv_saadc_evt_t const * p_event )
 				
 				single_format_data(ble_bin_buffer, "rsn:",  batt_lvl_in_milli_volt_1);
 
-						binary_tx_handler(ble_bin_buffer,3);
+						dr_binary_tx_safe(ble_bin_buffer,3);
 				//data_tx_handler(ble_tx_buffer);
 			}
 		}